Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of Ba0.5Sr0.5TiO3 thin films

Duncan Barker, PM Suherman, Timothy Jackson, Michael Lancaster

Electronic, Electrical and Systems Engineering

Research output: Contribution to conference (unpublished) › Paper

2 Citations (Scopus)

1 results

Finished
Advanced Microwave Devices for Frequency-Agile Applications
Lancaster, M. & Jackson, T.
Engineering & Physical Science Research Council
28/11/05 → 27/05/09
Project: Research Councils