Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of Ba0.5Sr0.5TiO3 thin films

Duncan Barker; PM Suherman; Timothy Jackson; Michael Lancaster

doi:10.1109/isaf.2009.5307571

Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of Ba0.5Sr0.5TiO3 thin films

Duncan Barker, PM Suherman, Timothy Jackson, Michael Lancaster

Electronic, Electrical and Systems Engineering

Research output: Contribution to conference (unpublished) › Paper

2 Citations (Scopus)

Original language	English
Pages	1-6
Number of pages	6
DOIs	https://doi.org/10.1109/isaf.2009.5307571
Publication status	Published - 27 Aug 2009
Event	2009 18th IEEE International Symposium on the Applications of Ferroelectrics: 2009 18th IEEE International Symposium on the Applications of Ferroelectrics (ISAF) - Duration: 27 Aug 2009 → …

Conference

Conference	2009 18th IEEE International Symposium on the Applications of Ferroelectrics: 2009 18th IEEE International Symposium on the Applications of Ferroelectrics (ISAF)
Period	27/08/09 → …

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10.1109/isaf.2009.5307571

Advanced Microwave Devices for Frequency-Agile Applications
Lancaster, M. (Principal Investigator) & Jackson, T. (Co-Investigator)
Engineering & Physical Science Research Council
28/11/05 → 27/05/09
Project: Research Councils

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Barker, D., Suherman, PM., Jackson, T., & Lancaster, M. (2009). Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of Ba0.5Sr0.5TiO3 thin films. 1-6. Paper presented at 2009 18th IEEE International Symposium on the Applications of Ferroelectrics: 2009 18th IEEE International Symposium on the Applications of Ferroelectrics (ISAF). https://doi.org/10.1109/isaf.2009.5307571

Barker, Duncan ; Suherman, PM ; Jackson, Timothy et al. / Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of Ba0.5Sr0.5TiO3 thin films. Paper presented at 2009 18th IEEE International Symposium on the Applications of Ferroelectrics: 2009 18th IEEE International Symposium on the Applications of Ferroelectrics (ISAF).6 p.

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title = "Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of Ba0.5Sr0.5TiO3 thin films",

author = "Duncan Barker and PM Suherman and Timothy Jackson and Michael Lancaster",

year = "2009",

month = aug,

day = "27",

doi = "10.1109/isaf.2009.5307571",

language = "English",

pages = "1--6",

note = "2009 18th IEEE International Symposium on the Applications of Ferroelectrics: 2009 18th IEEE International Symposium on the Applications of Ferroelectrics (ISAF) ; Conference date: 27-08-2009",

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Barker, D, Suherman, PM, Jackson, T & Lancaster, M 2009, 'Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of Ba0.5Sr0.5TiO3 thin films', Paper presented at 2009 18th IEEE International Symposium on the Applications of Ferroelectrics: 2009 18th IEEE International Symposium on the Applications of Ferroelectrics (ISAF), 27/08/09 pp. 1-6. https://doi.org/10.1109/isaf.2009.5307571

Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of Ba0.5Sr0.5TiO3 thin films. / Barker, Duncan; Suherman, PM; Jackson, Timothy et al.
2009. 1-6 Paper presented at 2009 18th IEEE International Symposium on the Applications of Ferroelectrics: 2009 18th IEEE International Symposium on the Applications of Ferroelectrics (ISAF).

Research output: Contribution to conference (unpublished) › Paper

TY - CONF

T1 - Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of Ba0.5Sr0.5TiO3 thin films

AU - Barker, Duncan

AU - Suherman, PM

AU - Jackson, Timothy

AU - Lancaster, Michael

PY - 2009/8/27

Y1 - 2009/8/27

U2 - 10.1109/isaf.2009.5307571

DO - 10.1109/isaf.2009.5307571

M3 - Paper

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EP - 6

T2 - 2009 18th IEEE International Symposium on the Applications of Ferroelectrics: 2009 18th IEEE International Symposium on the Applications of Ferroelectrics (ISAF)

Y2 - 27 August 2009

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Barker D, Suherman PM, Jackson T, Lancaster M. Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of Ba0.5Sr0.5TiO3 thin films. 2009. Paper presented at 2009 18th IEEE International Symposium on the Applications of Ferroelectrics: 2009 18th IEEE International Symposium on the Applications of Ferroelectrics (ISAF). doi: 10.1109/isaf.2009.5307571

Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of Ba0.5Sr0.5TiO3 thin films

Conference

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Projects

Advanced Microwave Devices for Frequency-Agile Applications

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