Mechanical assisted corrosion: An investigation of thin film components used in flexible optoelectronic applications

Research output: Contribution to journalConference article

Authors

  • Nicholas J. Morris
  • Konstantinos A. Sierros
  • Karpagavalli Ramji
  • Darran R. Cairns
  • Stephen Kukureka

Colleges, School and Institutes

External organisations

  • West Virginia University
  • Dept. of Metallurgy and Materials

Abstract

During flexible optoelectronic device packaging, acid containing layers initiate the functional failure of the underlying indium tin oxide film. We experimentally investigate the stress-assisted corrosion cracking of thin conductive optoelectronic components. It is essential to understand the stress corrosion mechanisms in order to design highly durable flexible electronic structures.

Details

Original languageEnglish
Pages (from-to)1461-1464
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume39
Issue number3
Publication statusPublished - 30 Oct 2008
Event2008 SID International Symposium - Los Angeles, CA, United States
Duration: 20 May 200821 May 2008

ASJC Scopus subject areas