Mechanical assisted corrosion: An investigation of thin film components used in flexible optoelectronic applications

Research output: Contribution to journalConference articlepeer-review


  • Nicholas J. Morris
  • Konstantinos A. Sierros
  • Karpagavalli Ramji
  • Darran R. Cairns
  • Stephen Kukureka

Colleges, School and Institutes

External organisations

  • West Virginia University
  • Dept. of Metallurgy and Materials


During flexible optoelectronic device packaging, acid containing layers initiate the functional failure of the underlying indium tin oxide film. We experimentally investigate the stress-assisted corrosion cracking of thin conductive optoelectronic components. It is essential to understand the stress corrosion mechanisms in order to design highly durable flexible electronic structures.


Original languageEnglish
Pages (from-to)1461-1464
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Issue number3
Publication statusPublished - 30 Oct 2008
Event2008 SID International Symposium - Los Angeles, CA, United States
Duration: 20 May 200821 May 2008

ASJC Scopus subject areas