Abstract
X-ray phase-contrast imaging can substantially enhance image contrast for weakly absorbing samples. The fabrication of dedicated optics remains a major barrier, especially in high-energy regions (i.e. over 50 keV). Here, the authors perform X-ray phase-contrast imaging by using engineered porous materials as random absorption masks, which provides an alternative solution to extend X-ray phase-contrast imaging into previously challenging higher energy regions. The authors have measured various samples to demonstrate the feasibility of the proposed engineering materials. This technique could potentially be useful for studying samples across a wide range of applications and disciplines.
Original language | English |
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Pages (from-to) | 1182-1188 |
Number of pages | 7 |
Journal | Journal of Synchrotron Radiation |
Volume | 25 |
Issue number | 4 |
Early online date | 12 Jun 2018 |
DOIs | |
Publication status | Published - 1 Jul 2018 |
Keywords
- hard X-rays
- high-energy regions
- porous materials
- random attenuation masks
- speckle technique
- X-ray phase imaging
ASJC Scopus subject areas
- Radiation
- Nuclear and High Energy Physics
- Instrumentation