X-ray phase-contrast imaging with engineered porous materials over 50 keV

Hongchang Wang*, Biao Cai, Matthew James Pankhurst, Tunhe Zhou, Yogesh Kashyap, Robert C Atwood, Nolwenn Le Gall, Peter Lee, Michael Drakopoulos, Kawal Sawhney

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)
147 Downloads (Pure)


X-ray phase-contrast imaging can substantially enhance image contrast for weakly absorbing samples. The fabrication of dedicated optics remains a major barrier, especially in high-energy regions (i.e. over 50 keV). Here, the authors perform X-ray phase-contrast imaging by using engineered porous materials as random absorption masks, which provides an alternative solution to extend X-ray phase-contrast imaging into previously challenging higher energy regions. The authors have measured various samples to demonstrate the feasibility of the proposed engineering materials. This technique could potentially be useful for studying samples across a wide range of applications and disciplines.

Original languageEnglish
Pages (from-to)1182-1188
Number of pages7
JournalJournal of Synchrotron Radiation
Issue number4
Early online date12 Jun 2018
Publication statusPublished - 1 Jul 2018


  • hard X-rays
  • high-energy regions
  • porous materials
  • random attenuation masks
  • speckle technique
  • X-ray phase imaging

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation


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