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Vacuum-UV fluorescence spectroscopy of SiF4SiF4 in the range 10–30 eV
H. Biehl, Kenneth Boyle, D. P. Seccombe, D. M. Smith, R. P. Tuckett, K. R. Yoxall, H. Baumgärtel, H. W. Jochims
Research output: Contribution to journal › Article › peer-review
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