Uncertainties in the permittivity of thin films extracted from measurements with near field microwave microscopy calibrated by an image charge model

Mathematics

• Microscopy 100%
• Microwave 90%
• Permittivity 90%
• Near-field 88%
• Thin Films 84%
• Microscope 74%
• Charge 68%
• Wavelength 58%
• Uncertainty 57%
• Model 22%
• Length Scale 21%
• Material Properties 20%
• Probe 20%
• Substrate 19%
• Model-based 15%
• Interaction 12%
• Characterization 8%

Engineering & Materials Science

• Microscopic examination 73%
• Permittivity 67%
• Thin films 64%
• Microwaves 59%
• Microscopes 48%
• Wavelength 44%
• Uncertainty 42%
• Materials properties 14%
• Substrates 11%

Physics & Astronomy

• near fields 57%
• microscopy 47%
• permittivity 46%
• microwaves 45%
• microscopes 39%
• thin films 34%
• microwave probes 26%
• wavelengths 24%
• frequency shift 16%
• characterization 9%
• interactions 6%