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The prediction of crack propagation in coarse grain RR1000 using a unified modelling approach
B. Engel*, J. P. Rouse, C. J. Hyde, W. Lavie, D. Leidermark, S. Stekovic, S. J. Williams, S. J. Pattison, B. Grant, M. T. Whittaker, J. P. Jones, R. J. Lancaster, H. Y. Li
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
3
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(Scopus)