Structural, vibrational, and dielectric properties of a Ba SrTi O thin film: Temperature and electric field dependence from Raman spectroscopy, x-ray diffraction, and microwave measurements
H. Bouyanfif, P.M. Suherman, T.J. Jackson, M. El Marssi, J. Hriljac
Research output: Contribution to journal › Article › peer-review
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