Abstract
This article details a methodology to find bugs across multiple abstraction layers of the system, specifically at the hardware-software boundary. The article describes how existing tools can help with such methodology and limitations.
Original language | English |
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Pages (from-to) | 7-13 |
Number of pages | 7 |
Journal | IEEE Design and Test |
Volume | 38 |
Issue number | 1 |
Early online date | 3 Aug 2020 |
DOIs | |
Publication status | Published - Feb 2021 |
Keywords
- security evaluation
- System-on-Chip
- dynamic analysis
- HardFails