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Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave Microscope
A. P. Gregory*, J. F. Blackburn, K. Lees, R. N. Clarke, T. E. Hodgetts, S. M. Hanham, N. Klein
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
12
Citations
(Scopus)