Abstract
We propose an efficient method for image registration based on iteratively fitting a parametric model to the output of an elastic registration. It combines the flexibility of elastic registration - able to estimate complex deformations - with the robustness of parametric registration - able to estimate very large displacement. Our approach is made feasible by using the recent Local All-Pass (LAP) algorithm; a fast and accurate filter-based method for estimating the local deformation between two images. Moreover, at each iteration we fit a linear parametric model to the local deformation which is equivalent to solving a linear system of equations (very fast and efficient). We use a quadratic polynomial model however the framework can easily be extended to more complicated models. The significant advantage of the proposed method is its robustness to model mis-match (e.g. noise and blurring). Experimental results on synthetic images and real images demonstrate that the proposed algorithm is highly accurate and outperforms a selection of image registration approaches.
Original language | English |
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Title of host publication | 2017 IEEE International Conference on Image Processing, ICIP 2017 - Proceedings |
Publisher | IEEE Computer Society Press |
Pages | 1492-1496 |
Number of pages | 5 |
ISBN (Electronic) | 9781509021758 |
DOIs | |
Publication status | Published - 20 Feb 2018 |
Event | 24th IEEE International Conference on Image Processing, ICIP 2017 - Beijing, China Duration: 17 Sept 2017 → 20 Sept 2017 |
Publication series
Name | Proceedings - International Conference on Image Processing, ICIP |
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Volume | 2017-September |
ISSN (Print) | 1522-4880 |
Conference
Conference | 24th IEEE International Conference on Image Processing, ICIP 2017 |
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Country/Territory | China |
City | Beijing |
Period | 17/09/17 → 20/09/17 |
Bibliographical note
Funding Information:This work was supported in part by a grant #CUHK14200114 of the Hong Kong Research Grants Council.
Publisher Copyright:
© 2017 IEEE.
ASJC Scopus subject areas
- Software
- Computer Vision and Pattern Recognition
- Signal Processing