Instabilities in Focused Ion Beam-patterned Au nanowires

Jay Naik, Philip Prewett, K Das, AK Raychaudhuri

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)


Focused Ion Beam (FIB) technology has become an indispensable enabling tool for micro nano fabrications. One important application is to use FIB for patterning conducting nanowires of metals down to a few tens of nanometre for applications such as interconnects, heaters and temperature nanosensors. A series of experiments on Au nanowires fabricated by FIB on SixNy membrane show that nanowires with width
Original languageEnglish
Pages (from-to)2840-2843
Number of pages4
JournalMicroelectron Engineering
Issue number9
Early online date12 May 2011
Publication statusPublished - 1 Sept 2011


  • Focused Ion Beam
  • Nanowire
  • Rayleigh-Plateau instability


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