Improved sectioning in a slit scanning confocal microscope

Vincent Poher; Gordon T. Kennedy; Hugh B. Manning; Dylan Owen; Haoxiang X. Zhang; Erdan Gu; Martin D. Dawson; Paul M. W. French; Mark A. A. Neil

doi:10.1364/OL.33.001813

Improved sectioning in a slit scanning confocal microscope

Vincent Poher, Gordon T. Kennedy, Hugh B. Manning, Dylan Owen, Haoxiang X. Zhang, Erdan Gu, Martin D. Dawson, Paul M. W. French, Mark A. A. Neil

Immunology and Immunotherapy

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Abstract

We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case. (C) 2008 Optical Society of America.

Original language	English
Pages (from-to)	1813-1815
Number of pages	3
Journal	Optics Letters
Volume	33
Issue number	16
DOIs	https://doi.org/10.1364/OL.33.001813
Publication status	Published - 15 Aug 2008

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title = "Improved sectioning in a slit scanning confocal microscope",

abstract = "We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case. (C) 2008 Optical Society of America.",

author = "Vincent Poher and Kennedy, {Gordon T.} and Manning, {Hugh B.} and Dylan Owen and Zhang, {Haoxiang X.} and Erdan Gu and Dawson, {Martin D.} and French, {Paul M. W.} and Neil, {Mark A. A.}",

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T1 - Improved sectioning in a slit scanning confocal microscope

AU - Poher, Vincent

AU - Kennedy, Gordon T.

AU - Manning, Hugh B.

AU - Owen, Dylan

AU - Zhang, Haoxiang X.

AU - Gu, Erdan

AU - Dawson, Martin D.

AU - French, Paul M. W.

AU - Neil, Mark A. A.

PY - 2008/8/15

Y1 - 2008/8/15

N2 - We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case. (C) 2008 Optical Society of America.

AB - We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case. (C) 2008 Optical Society of America.

U2 - 10.1364/OL.33.001813

DO - 10.1364/OL.33.001813

M3 - Article

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VL - 33

SP - 1813

EP - 1815

JO - Optics Letters

JF - Optics Letters

IS - 16

ER -

Improved sectioning in a slit scanning confocal microscope

Abstract

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