Fabrication of diamond micro size tool using FIB

X. Ding*, G. C. Lim, David Lee Butler, C. K. Cheng

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A study was undertaken to investigate the feasibility of sputtering a SCD (single crystal diamond) tool using FIB (Focused Ion Beam). The machining removal rate, surface morphology and form accuracy were evaluated with respect to the ion beam parameters through sputtering pockets on the top diamond surface.

Original languageEnglish
Title of host publicationProceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007
EditorsE. Thornett
Publishereuspen
Pages477-480
Number of pages4
ISBN (Electronic)0955308224, 9780955308222
Publication statusPublished - 2007
Event7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007 - Bremen, Germany
Duration: 20 May 200724 May 2007

Publication series

NameProceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007
Volume2

Conference

Conference7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007
Country/TerritoryGermany
CityBremen
Period20/05/0724/05/07

ASJC Scopus subject areas

  • General Materials Science
  • Instrumentation
  • Environmental Engineering
  • Industrial and Manufacturing Engineering
  • Mechanical Engineering

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