A plenoptic imaging system records simultaneously the intensity and the direction of the rays of light. This additional information allows many post processing features such as 3D imaging, synthetic refocusing and potentially evaluation of wavefront aberrations. In this paper the effects of low order aberrations on a simple plenoptic imaging system have been investigated using a wave optics simulations approach.
|Proceedings of SPIE
|Modeling Aspects in Optical Metrology V
|23/06/15 → 25/06/15
- Imaging systems
- Wavefront aberrations