Application of a Atomic Force Microscope in Barrier Film Defect Analysis

J Bottomley, K Rakos, Kevin Kendall, Richard Greenwood

Research output: Contribution to conference (unpublished) › Paper

Original language	English
Publication status	Published - 1 Jan 2009
Event	Seeing at the Nanoscale, July 2009 - Duration: 1 Jan 2009 → …

Conference	Seeing at the Nanoscale, July 2009
Period	1/01/09 → …

Cite this

@conference{94d073ace9b8438a9b6a7102a8d38ad1,

title = "Application of a Atomic Force Microscope in Barrier Film Defect Analysis",

author = "J Bottomley and K Rakos and Kevin Kendall and Richard Greenwood",

year = "2009",

month = jan,

day = "1",

language = "English",

note = "Seeing at the Nanoscale, July 2009 ; Conference date: 01-01-2009",

}