VOG-enhanced ICA for removing blink and eye-movement artefacts from EEG

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Standard

VOG-enhanced ICA for removing blink and eye-movement artefacts from EEG. / Samadi, Mohammad Reza Haji; Zakeri, Zohreh; Cooke, Neil.

3rd IEEE EMBS International Conference on Biomedical and Health Informatics, BHI 2016. Institute of Electrical and Electronics Engineers (IEEE), 2016. p. 603-606 7455970.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Harvard

Samadi, MRH, Zakeri, Z & Cooke, N 2016, VOG-enhanced ICA for removing blink and eye-movement artefacts from EEG. in 3rd IEEE EMBS International Conference on Biomedical and Health Informatics, BHI 2016., 7455970, Institute of Electrical and Electronics Engineers (IEEE), pp. 603-606, 3rd IEEE EMBS International Conference on Biomedical and Health Informatics, BHI 2016, Las Vegas, United States, 24/02/16. https://doi.org/10.1109/BHI.2016.7455970

APA

Samadi, M. R. H., Zakeri, Z., & Cooke, N. (2016). VOG-enhanced ICA for removing blink and eye-movement artefacts from EEG. In 3rd IEEE EMBS International Conference on Biomedical and Health Informatics, BHI 2016 (pp. 603-606). [7455970] Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/BHI.2016.7455970

Vancouver

Samadi MRH, Zakeri Z, Cooke N. VOG-enhanced ICA for removing blink and eye-movement artefacts from EEG. In 3rd IEEE EMBS International Conference on Biomedical and Health Informatics, BHI 2016. Institute of Electrical and Electronics Engineers (IEEE). 2016. p. 603-606. 7455970 https://doi.org/10.1109/BHI.2016.7455970

Author

Samadi, Mohammad Reza Haji ; Zakeri, Zohreh ; Cooke, Neil. / VOG-enhanced ICA for removing blink and eye-movement artefacts from EEG. 3rd IEEE EMBS International Conference on Biomedical and Health Informatics, BHI 2016. Institute of Electrical and Electronics Engineers (IEEE), 2016. pp. 603-606

Bibtex

@inproceedings{5d1849d0448840a08f313c0e1ac55dbc,
title = "VOG-enhanced ICA for removing blink and eye-movement artefacts from EEG",
abstract = "The steady-state visual evoked potential (SSVEP) is reliable for many paradigms such as clinical neuroscience and brain computer interfaces (BCI), providing high information throughput with minimal between-person variations. However, Electrooculogram (EOG) artefacts in Electroencephalography (EEG) signal limit applications with dynamic SSVEP stimuli due to eye movement and blinks. Independent Component Analysis (ICA) is a successful method for removing EOG artefacts. We propose 'Blink VOG-ICA' (BVOG-ICA) - an enhanced ICA algorithm that uses eye tracker video-oculography (VOG) eye movement and blink detection information. It demonstrates improved performance compared to ICA variants Plochl and our previous VOG-ICA when evaluated on matched VOG and EEG data. SSVEP classification accuracy for the post-ICA clean EEG consequently improves 7% and 4% for static and dynamic SSVEP stimuli respectively, suggesting BVOG-ICA as a potentially reliable automatic EOG artefact removal method for SSVEP paradigms.",
author = "Samadi, {Mohammad Reza Haji} and Zohreh Zakeri and Neil Cooke",
year = "2016",
month = apr,
day = "21",
doi = "10.1109/BHI.2016.7455970",
language = "English",
isbn = "9781509024551",
pages = "603--606",
booktitle = "3rd IEEE EMBS International Conference on Biomedical and Health Informatics, BHI 2016",
publisher = "Institute of Electrical and Electronics Engineers (IEEE)",
note = "3rd IEEE EMBS International Conference on Biomedical and Health Informatics, BHI 2016 ; Conference date: 24-02-2016 Through 27-02-2016",

}

RIS

TY - GEN

T1 - VOG-enhanced ICA for removing blink and eye-movement artefacts from EEG

AU - Samadi, Mohammad Reza Haji

AU - Zakeri, Zohreh

AU - Cooke, Neil

PY - 2016/4/21

Y1 - 2016/4/21

N2 - The steady-state visual evoked potential (SSVEP) is reliable for many paradigms such as clinical neuroscience and brain computer interfaces (BCI), providing high information throughput with minimal between-person variations. However, Electrooculogram (EOG) artefacts in Electroencephalography (EEG) signal limit applications with dynamic SSVEP stimuli due to eye movement and blinks. Independent Component Analysis (ICA) is a successful method for removing EOG artefacts. We propose 'Blink VOG-ICA' (BVOG-ICA) - an enhanced ICA algorithm that uses eye tracker video-oculography (VOG) eye movement and blink detection information. It demonstrates improved performance compared to ICA variants Plochl and our previous VOG-ICA when evaluated on matched VOG and EEG data. SSVEP classification accuracy for the post-ICA clean EEG consequently improves 7% and 4% for static and dynamic SSVEP stimuli respectively, suggesting BVOG-ICA as a potentially reliable automatic EOG artefact removal method for SSVEP paradigms.

AB - The steady-state visual evoked potential (SSVEP) is reliable for many paradigms such as clinical neuroscience and brain computer interfaces (BCI), providing high information throughput with minimal between-person variations. However, Electrooculogram (EOG) artefacts in Electroencephalography (EEG) signal limit applications with dynamic SSVEP stimuli due to eye movement and blinks. Independent Component Analysis (ICA) is a successful method for removing EOG artefacts. We propose 'Blink VOG-ICA' (BVOG-ICA) - an enhanced ICA algorithm that uses eye tracker video-oculography (VOG) eye movement and blink detection information. It demonstrates improved performance compared to ICA variants Plochl and our previous VOG-ICA when evaluated on matched VOG and EEG data. SSVEP classification accuracy for the post-ICA clean EEG consequently improves 7% and 4% for static and dynamic SSVEP stimuli respectively, suggesting BVOG-ICA as a potentially reliable automatic EOG artefact removal method for SSVEP paradigms.

UR - http://www.scopus.com/inward/record.url?scp=84968593303&partnerID=8YFLogxK

U2 - 10.1109/BHI.2016.7455970

DO - 10.1109/BHI.2016.7455970

M3 - Conference contribution

AN - SCOPUS:84968593303

SN - 9781509024551

SP - 603

EP - 606

BT - 3rd IEEE EMBS International Conference on Biomedical and Health Informatics, BHI 2016

PB - Institute of Electrical and Electronics Engineers (IEEE)

T2 - 3rd IEEE EMBS International Conference on Biomedical and Health Informatics, BHI 2016

Y2 - 24 February 2016 through 27 February 2016

ER -