The effect of different oxidation routines on the properties of surface oxidised epitaxial NiO layers on biaxially textured Ni tapes

Surface oxidation epitaxy layers were produced by thermal oxidation of biaxially textured Ni tape under two different regimes. Firstly, upquenching to the oxidation temperature (1200 degreesC) and down quenching after holding for 1 h and secondly, ramping up at 300 degreesC/h and furnace cooling after holding. The texture and morphology of the oxide layers obtained were assessed by X-ray diffraction and electron backscatter diffraction. Both samples exhibited a 45degrees rotated cube texture associated with smooth regions on the oxide surface and a (1 1 1) fibre texture associated with protruding, rough regions. The ramped sample had a much lower density of these rough regions and is therefore more suitable for the deposition of subsequent. functional layers. (C) 2002 Published by Elsevier Science B.V.