TEM study of the deformation structures around nano-scratches

PC Wo; Ian Jones; AHW Ngan

doi:10.1080/14786430802148999

TEM study of the deformation structures around nano-scratches

PC Wo, Ian Jones, AHW Ngan

Metallurgy and Materials

Research output: Contribution to journal › Article

6 Citations (Scopus)

Abstract

An in-plane transmission electron microscopy (TEM) investigation carried out on nano-scratches made in a Ni3Al foil revealed a high dislocation density within the scratch core, resulting in severe crystal rotations. The amount and sense of rotation were found to be asymmetrical about the longitudinal centre line of the scratch. Cross-sectional TEM analysis revealed that almost all the dislocations were confined within a semicircular zone having a radius similar to the calculated tip-sample contact size during scratching, in agreement with the in-plane TEM observations.

Original language	English
Pages (from-to)	1369-1388
Number of pages	20
Journal	Philosophical Magazine
Volume	88
Issue number	9
DOIs	https://doi.org/10.1080/14786430802148999
Publication status	Published - 1 Jan 2008

Keywords

TEM
dislocations
nano-scratch
focused ion-beam milling
nanoidentation

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10.1080/14786430802148999

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abstract = "An in-plane transmission electron microscopy (TEM) investigation carried out on nano-scratches made in a Ni3Al foil revealed a high dislocation density within the scratch core, resulting in severe crystal rotations. The amount and sense of rotation were found to be asymmetrical about the longitudinal centre line of the scratch. Cross-sectional TEM analysis revealed that almost all the dislocations were confined within a semicircular zone having a radius similar to the calculated tip-sample contact size during scratching, in agreement with the in-plane TEM observations.",

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AB - An in-plane transmission electron microscopy (TEM) investigation carried out on nano-scratches made in a Ni3Al foil revealed a high dislocation density within the scratch core, resulting in severe crystal rotations. The amount and sense of rotation were found to be asymmetrical about the longitudinal centre line of the scratch. Cross-sectional TEM analysis revealed that almost all the dislocations were confined within a semicircular zone having a radius similar to the calculated tip-sample contact size during scratching, in agreement with the in-plane TEM observations.

KW - TEM

KW - dislocations

KW - nano-scratch

KW - focused ion-beam milling

KW - nanoidentation

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DO - 10.1080/14786430802148999

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TEM study of the deformation structures around nano-scratches

Abstract

Keywords

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