Study the grain boundary triple junction segregation of phosphorus in a nickel-base alloy using energy dispersive X-ray spectroscopy on a transmission electron microscope

Jinsen Tian, Yu Lung Chiu*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)
177 Downloads (Pure)

Abstract

Segregation of phosphorus at grain boundary triple junctions in a nickel-base alloy was measured using energy dispersive X-ray spectroscopy on a transmission electron microscope. It was found that the triple junction segregation of phosphorus varies with grain boundaries in that the concentration of phosphorus at triple junction can be higher or lower than that at the adjacent grain boundaries. A concentration gradient was detected along some grain boundaries within a distance of 5–100 nm from the associated triple junctions. The results are discussed with regards to various structural and atomistic diffusion characteristics.

Original languageEnglish
Pages (from-to)156-161
Number of pages6
JournalMaterials Characterization
Volume148
Early online date31 Dec 2018
DOIs
Publication statusPublished - Feb 2019

Keywords

  • Energy dispersive X-ray spectroscopy (EDS)
  • Ni-base alloy
  • Transmission electron microscope
  • Triple junction segregation

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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