Stress corrosion cracking of patterned indium tin oxide electrodes for flexible displays

Research output: Contribution to journalConference articlepeer-review

Authors

Colleges, School and Institutes

External organisations

  • West Virginia University
  • Birmingham University
  • Dept. of Metallurgical and Materials

Abstract

ITO electrodes are used broadly for displays. Patterning can cause micro-cracks and for flexible devices ITO is also often amorphous. Amorphous ITO can be etched by acid containing polymer layers. The combined effect of etching and stress can also lead to stress corrosion cracking. We report on these phenomena.

Details

Original languageEnglish
Pages (from-to)1790-1793
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume38
Issue number2
Publication statusPublished - 22 Aug 2007
Event2007 SID International Symposium - Long Beach, CA, United States
Duration: 23 May 200725 May 2007

ASJC Scopus subject areas