Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy

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Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy. / Monti, Tamara; Udoudo, Ofonime; Sperin, Kevin; Dodds, Chris; Jackson, Timothy; Kingman, Sam.

In: IEEE Transactions on Microwave Theory and Techniques, Vol. 65, No. 6, 06.2017, p. 2162-2170.

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Monti, Tamara ; Udoudo, Ofonime ; Sperin, Kevin ; Dodds, Chris ; Jackson, Timothy ; Kingman, Sam. / Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy. In: IEEE Transactions on Microwave Theory and Techniques. 2017 ; Vol. 65, No. 6. pp. 2162-2170.

Bibtex

@article{56ace60cb764466cafd8ca3e1c86dc34,
title = "Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy",
abstract = "A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this task employs relatively large tips (tens of micrometers in diameter). Additionally, in order to make the instrument more suitable for high-throughput analysis, an original design for rapid tip changes is implemented. Single-point measurements of dielectric constant at random locations on the sample wereperformed, leading to histograms of dielectric constant values. These are related to the dielectric constants of the two phases using Maxwell–Garnett effective medium theory, taking into account the volume-of-interaction in the sample beneath the tip",
keywords = "Dielectric constant, dielectric materials, Maxwell–Garnett approximation, microwave measurements, near-field measurements, nonhomogeneous media, scanning microwave microscope (SMM), statistical distributions",
author = "Tamara Monti and Ofonime Udoudo and Kevin Sperin and Chris Dodds and Timothy Jackson and Sam Kingman",
note = "(c) 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works",
year = "2017",
month = jun,
doi = "10.1109/TMTT.2016.2642940",
language = "English",
volume = "65",
pages = "2162--2170",
journal = "IEEE Transactions on Microwave Theory and Techniques",
issn = "0018-9480",
publisher = "IEEE Xplore",
number = "6",

}

RIS

TY - JOUR

T1 - Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy

AU - Monti, Tamara

AU - Udoudo, Ofonime

AU - Sperin, Kevin

AU - Dodds, Chris

AU - Jackson, Timothy

AU - Kingman, Sam

N1 - (c) 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works

PY - 2017/6

Y1 - 2017/6

N2 - A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this task employs relatively large tips (tens of micrometers in diameter). Additionally, in order to make the instrument more suitable for high-throughput analysis, an original design for rapid tip changes is implemented. Single-point measurements of dielectric constant at random locations on the sample wereperformed, leading to histograms of dielectric constant values. These are related to the dielectric constants of the two phases using Maxwell–Garnett effective medium theory, taking into account the volume-of-interaction in the sample beneath the tip

AB - A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this task employs relatively large tips (tens of micrometers in diameter). Additionally, in order to make the instrument more suitable for high-throughput analysis, an original design for rapid tip changes is implemented. Single-point measurements of dielectric constant at random locations on the sample wereperformed, leading to histograms of dielectric constant values. These are related to the dielectric constants of the two phases using Maxwell–Garnett effective medium theory, taking into account the volume-of-interaction in the sample beneath the tip

KW - Dielectric constant

KW - dielectric materials

KW - Maxwell–Garnett approximation

KW - microwave measurements

KW - near-field measurements

KW - nonhomogeneous media

KW - scanning microwave microscope (SMM)

KW - statistical distributions

U2 - 10.1109/TMTT.2016.2642940

DO - 10.1109/TMTT.2016.2642940

M3 - Article

VL - 65

SP - 2162

EP - 2170

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

SN - 0018-9480

IS - 6

ER -