Secondary phase area fraction determination using SEM-EDS quantitative mapping

Minshi Wang; Yulung Chiu; Dominique Flahaut; Ian P. Jones; Zhu Zhang

doi:10.1016/j.matchar.2020.110506

Secondary phase area fraction determination using SEM-EDS quantitative mapping

Minshi Wang^*, Yulung Chiu, Dominique Flahaut, Ian P. Jones, Zhu Zhang

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

A methodology for determining secondary phase area fraction using X-ray energy dispersive spectroscopy (EDS) quantitative mapping is proposed, based on the operating parameters, principally the electron beam energy, beam current, pixel dwell time and step size. This methodology has successfully been employed to determine the area fractions of different phases in two different high performance micro alloy steels. Some limitations of the method have been demonstrated via a determination of the secondary phase area fraction in a magnesium alloy.

Original language	English
Article number	110506
Journal	Materials Characterization
Volume	167
DOIs	https://doi.org/10.1016/j.matchar.2020.110506
Publication status	Published - Sept 2020

Keywords

Area fraction determination
Energy dispersive X-ray spectroscopy (EDS)
HP-micro-alloy
Quantitative mapping

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.1016/j.matchar.2020.110506

Cite this

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title = "Secondary phase area fraction determination using SEM-EDS quantitative mapping",

abstract = "A methodology for determining secondary phase area fraction using X-ray energy dispersive spectroscopy (EDS) quantitative mapping is proposed, based on the operating parameters, principally the electron beam energy, beam current, pixel dwell time and step size. This methodology has successfully been employed to determine the area fractions of different phases in two different high performance micro alloy steels. Some limitations of the method have been demonstrated via a determination of the secondary phase area fraction in a magnesium alloy.",

keywords = "Area fraction determination, Energy dispersive X-ray spectroscopy (EDS), HP-micro-alloy, Quantitative mapping",

author = "Minshi Wang and Yulung Chiu and Dominique Flahaut and Jones, {Ian P.} and Zhu Zhang",

year = "2020",

month = sep,

doi = "10.1016/j.matchar.2020.110506",

language = "English",

volume = "167",

journal = "Materials Characterization",

issn = "1044-5803",

publisher = "Elsevier",

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TY - JOUR

T1 - Secondary phase area fraction determination using SEM-EDS quantitative mapping

AU - Wang, Minshi

AU - Chiu, Yulung

AU - Flahaut, Dominique

AU - Jones, Ian P.

AU - Zhang, Zhu

PY - 2020/9

Y1 - 2020/9

N2 - A methodology for determining secondary phase area fraction using X-ray energy dispersive spectroscopy (EDS) quantitative mapping is proposed, based on the operating parameters, principally the electron beam energy, beam current, pixel dwell time and step size. This methodology has successfully been employed to determine the area fractions of different phases in two different high performance micro alloy steels. Some limitations of the method have been demonstrated via a determination of the secondary phase area fraction in a magnesium alloy.

AB - A methodology for determining secondary phase area fraction using X-ray energy dispersive spectroscopy (EDS) quantitative mapping is proposed, based on the operating parameters, principally the electron beam energy, beam current, pixel dwell time and step size. This methodology has successfully been employed to determine the area fractions of different phases in two different high performance micro alloy steels. Some limitations of the method have been demonstrated via a determination of the secondary phase area fraction in a magnesium alloy.

KW - Area fraction determination

KW - Energy dispersive X-ray spectroscopy (EDS)

KW - HP-micro-alloy

KW - Quantitative mapping

UR - http://www.scopus.com/inward/record.url?scp=85088111257&partnerID=8YFLogxK

U2 - 10.1016/j.matchar.2020.110506

DO - 10.1016/j.matchar.2020.110506

M3 - Article

AN - SCOPUS:85088111257

SN - 1044-5803

VL - 167

JO - Materials Characterization

JF - Materials Characterization

M1 - 110506

ER -

Secondary phase area fraction determination using SEM-EDS quantitative mapping

Abstract

Keywords

ASJC Scopus subject areas

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