Scanning probe energy loss spectroscopy with microfabricated coaxial tips

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Colleges, School and Institutes

Abstract

We report scanning probe energy loss spectroscopy (SPELS) measurements of a graphite surface taken with microfabricated coaxial tips. The SPELS spectra of graphite obtained with a grounded coaxial tip show the pi and sigma plasmon peaks and intense secondary electron emission (SEE) peaks. In comparison, spectra taken with a simple Au cathode tip also showed the pi and sigma plasmon peaks but much weaker SEE peaks. The enhanced collection of secondary electrons enables the unoccupied band structure of the surface (i.e., above E-vac) to be explored.

Details

Original languageEnglish
Pages (from-to)161411
Number of pages1
JournalPhysical Review B
Volume81
Issue number16
Publication statusPublished - 1 Apr 2010