Scanning probe energy loss spectroscopy below 50 nm resolution

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Scanning probe energy loss spectroscopy below 50 nm resolution. / Festy, F; Palmer, Richard.

In: Applied Physics Letters, Vol. 85, No. 21, 01.01.2004, p. 5034-5036.

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@article{c18ac55cb5494b0f834efb408414233c,
title = "Scanning probe energy loss spectroscopy below 50 nm resolution",
abstract = "We report scanning probe energy loss spectroscopy (SPELS) measurements from a roughened Si(111) surface in ultrahigh vacuum. The experiments, which utilize a scanning tunneling microscope tip in the field emission mode as the electron source, establish that the spatial resolution in SPELS is better than 50 nm. The spectral maps acquired indicate different contrast mechanisms for the inelastically scattered and secondary electrons identified in the energy loss spectrum. (C) 2004 American Institute of Physics.",
author = "F Festy and Richard Palmer",
year = "2004",
month = jan,
day = "1",
doi = "10.1063/1.1818742",
language = "English",
volume = "85",
pages = "5034--5036",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics",
number = "21",

}

RIS

TY - JOUR

T1 - Scanning probe energy loss spectroscopy below 50 nm resolution

AU - Festy, F

AU - Palmer, Richard

PY - 2004/1/1

Y1 - 2004/1/1

N2 - We report scanning probe energy loss spectroscopy (SPELS) measurements from a roughened Si(111) surface in ultrahigh vacuum. The experiments, which utilize a scanning tunneling microscope tip in the field emission mode as the electron source, establish that the spatial resolution in SPELS is better than 50 nm. The spectral maps acquired indicate different contrast mechanisms for the inelastically scattered and secondary electrons identified in the energy loss spectrum. (C) 2004 American Institute of Physics.

AB - We report scanning probe energy loss spectroscopy (SPELS) measurements from a roughened Si(111) surface in ultrahigh vacuum. The experiments, which utilize a scanning tunneling microscope tip in the field emission mode as the electron source, establish that the spatial resolution in SPELS is better than 50 nm. The spectral maps acquired indicate different contrast mechanisms for the inelastically scattered and secondary electrons identified in the energy loss spectrum. (C) 2004 American Institute of Physics.

UR - http://www.scopus.com/inward/record.url?scp=19144362141&partnerID=8YFLogxK

U2 - 10.1063/1.1818742

DO - 10.1063/1.1818742

M3 - Article

VL - 85

SP - 5034

EP - 5036

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 21

ER -