Scanning probe energy loss spectroscopy below 50 nm resolution

Research output: Contribution to journalArticle

Authors

Colleges, School and Institutes

Abstract

We report scanning probe energy loss spectroscopy (SPELS) measurements from a roughened Si(111) surface in ultrahigh vacuum. The experiments, which utilize a scanning tunneling microscope tip in the field emission mode as the electron source, establish that the spatial resolution in SPELS is better than 50 nm. The spectral maps acquired indicate different contrast mechanisms for the inelastically scattered and secondary electrons identified in the energy loss spectrum. (C) 2004 American Institute of Physics.

Details

Original languageEnglish
Pages (from-to)5034-5036
Number of pages3
JournalApplied Physics Letters
Volume85
Issue number21
Publication statusPublished - 1 Jan 2004