Abstract
A novel method has been developed for preparing in situ straining samples for transmission electron microscopy (TEM) to study dislocation behaviour, here transmission through phase interfaces. A dual-beam focussed ion beam (FIB) microscope was used to extract an oriented foil from locations with specific crystallography in a sample which had been selected using electron backscattered diffraction (EBSD). The foil was attached to a pre-prepared substrate which was then strained in a TEM. The method has been demonstrated successfully by studying the 〈c+a〉 dislocation transmission through α/β interfaces in a commercial Ti-6Al-4V alloy.
Original language | English |
---|---|
Title of host publication | Ti 2011 - Proceedings of the 12th World Conference on Titanium |
Pages | 791-794 |
Number of pages | 4 |
Volume | 1 |
Publication status | Published - 1 Dec 2012 |
Event | 12th World Conference on Titanium, Ti 2011 - Beijing, China Duration: 19 Jun 2011 → 24 Jun 2011 |
Conference
Conference | 12th World Conference on Titanium, Ti 2011 |
---|---|
Country/Territory | China |
City | Beijing |
Period | 19/06/11 → 24/06/11 |
Keywords
- Electron backscattered diffraction
- Focused ion beam
- In situ straining
- Transmission electron microscopy
ASJC Scopus subject areas
- Ceramics and Composites