Preparation of an oriented FIB bed Ti-6Al-4V sample for in situ TEM observations of dislocation transmission through α/β interfaces

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Authors

Colleges, School and Institutes

External organisations

  • CEMES Centre d'Elaboration de Materiaux et d'Etudes Structurales

Abstract

A novel method has been developed for preparing in situ straining samples for transmission electron microscopy (TEM) to study dislocation behaviour, here transmission through phase interfaces. A dual-beam focussed ion beam (FIB) microscope was used to extract an oriented foil from locations with specific crystallography in a sample which had been selected using electron backscattered diffraction (EBSD). The foil was attached to a pre-prepared substrate which was then strained in a TEM. The method has been demonstrated successfully by studying the 〈c+a〉 dislocation transmission through α/β interfaces in a commercial Ti-6Al-4V alloy.

Details

Original languageEnglish
Title of host publicationTi 2011 - Proceedings of the 12th World Conference on Titanium
Publication statusPublished - 1 Dec 2012
Event12th World Conference on Titanium, Ti 2011 - Beijing, China
Duration: 19 Jun 201124 Jun 2011

Conference

Conference12th World Conference on Titanium, Ti 2011
CountryChina
CityBeijing
Period19/06/1124/06/11

Keywords

  • Electron backscattered diffraction, Focused ion beam, In situ straining, Transmission electron microscopy

ASJC Scopus subject areas