Persistent microslip bands in the lamellar TiAl structure subjected to room temperature fatigue

Ze Huang; Paul Bowen

doi:10.1016/S1359-6462(01)01114-9

Persistent microslip bands in the lamellar TiAl structure subjected to room temperature fatigue

Ze Huang, Paul Bowen

Metallurgy and Materials

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15 Citations (Scopus)

Abstract

This paper reports a detailed electron microscope study of slip occurring at the fatigue crack tips for an intermetallic fully lamellar TiAl alloy. The formation mechanism of the slip bands, their nature and constitution and the relationship between the slip bands and microcracking have been suggested. (C) 2001 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.

Original language	English
Pages (from-to)	931-937
Number of pages	7
Journal	Scripta Materialia
Volume	45
Issue number	8
DOIs	https://doi.org/10.1016/S1359-6462(01)01114-9
Publication status	Published - 1 Oct 2001

Keywords

transmission electron microscopy
shear bands
intermetallic
TiAl alloy
fatigue

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10.1016/S1359-6462(01)01114-9

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@article{6a2c40dc3bd34701a887f3217c69fd67,

title = "Persistent microslip bands in the lamellar TiAl structure subjected to room temperature fatigue",

abstract = "This paper reports a detailed electron microscope study of slip occurring at the fatigue crack tips for an intermetallic fully lamellar TiAl alloy. The formation mechanism of the slip bands, their nature and constitution and the relationship between the slip bands and microcracking have been suggested. (C) 2001 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.",

keywords = "transmission electron microscopy, shear bands, intermetallic, TiAl alloy, fatigue",

author = "Ze Huang and Paul Bowen",

year = "2001",

month = oct,

day = "1",

doi = "10.1016/S1359-6462(01)01114-9",

language = "English",

volume = "45",

pages = "931--937",

journal = "Scripta Materialia",

issn = "1872-8456",

publisher = "Elsevier",

number = "8",

}

TY - JOUR

T1 - Persistent microslip bands in the lamellar TiAl structure subjected to room temperature fatigue

AU - Huang, Ze

AU - Bowen, Paul

PY - 2001/10/1

Y1 - 2001/10/1

N2 - This paper reports a detailed electron microscope study of slip occurring at the fatigue crack tips for an intermetallic fully lamellar TiAl alloy. The formation mechanism of the slip bands, their nature and constitution and the relationship between the slip bands and microcracking have been suggested. (C) 2001 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.

AB - This paper reports a detailed electron microscope study of slip occurring at the fatigue crack tips for an intermetallic fully lamellar TiAl alloy. The formation mechanism of the slip bands, their nature and constitution and the relationship between the slip bands and microcracking have been suggested. (C) 2001 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.

KW - transmission electron microscopy

KW - shear bands

KW - intermetallic

KW - TiAl alloy

KW - fatigue

U2 - 10.1016/S1359-6462(01)01114-9

DO - 10.1016/S1359-6462(01)01114-9

M3 - Article

SN - 1872-8456

VL - 45

SP - 931

EP - 937

JO - Scripta Materialia

JF - Scripta Materialia

IS - 8

ER -

Persistent microslip bands in the lamellar TiAl structure subjected to room temperature fatigue

Abstract

Keywords

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