Perceived negative attitude of others predicts transition to psychosis in patients at risk of psychosis

RK Salokangas, P Patterson, M Heinimaa, T Svirkis, T From, L Vaskelainen, J Klosterkotter, Maximillian Birchwood, EPOS Group

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

Aim
Our previous study (Salokangas et al., 2009) suggested that the subjective experience of negative attitude of others (NAO) towards oneself is an early indicator of psychotic development. The aim of this prospective follow-up study was to test this hypothesis.

Methods
A total of 55 young psychiatric outpatients assessed as being at current risk of psychosis (CROP) were followed for up to 60 months and rates of transition to psychosis (TTP) identified. CROP was assessed employing the Bonn Scale for assessment of basic symptoms (Schultze-Lutter and Klosterkötter, 2002) and the Structured Interview for prodromal symptoms (Miller et al., 2002). TTP was defined by a psychotic episode lasting for more than one week. Associations between NAO at baseline and TTP were analyzed by a Cox regression survival analysis.

Results
Eight (14.5%) TTP were identified: four (57.1%) within seven NAO patients and four (8.7%) within forty-six non-NAO patients. In the multivariate Cox regression analysis, NAO at baseline significantly (P = 0.007) predicted TTP.

Conclusion
The prospective follow-up results support our hypothesis that subjective experience of NAO is an early indicator of psychotic in development.
Original languageEnglish
Pages (from-to)264
Number of pages266
JournalEuropean Psychiatry
Volume27
Issue number4
Early online date5 Feb 2011
DOIs
Publication statusPublished - 1 May 2012

Keywords

  • Attitude of others; Current risk of psychosis; Transition to psychosis

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