Mechanical assisted corrosion: An investigation of thin film components used in flexible optoelectronic applications

Nicholas J. Morris, Konstantinos A. Sierros, Karpagavalli Ramji, Darran R. Cairns, Stephen N. Kukureka

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)

Abstract

During flexible optoelectronic device packaging, acid containing layers initiate the functional failure of the underlying indium tin oxide film. We experimentally investigate the stress-assisted corrosion cracking of thin conductive optoelectronic components. It is essential to understand the stress corrosion mechanisms in order to design highly durable flexible electronic structures.

Original languageEnglish
Pages (from-to)1461-1464
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume39
Issue number3
Publication statusPublished - 30 Oct 2008
Event2008 SID International Symposium - Los Angeles, CA, United States
Duration: 20 May 200821 May 2008

ASJC Scopus subject areas

  • Engineering(all)

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