Measuring the implantation depth of silver clusters in graphite

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Measuring the implantation depth of silver clusters in graphite. / Kenny, Daniel; Weller, Suzanne; Couillard, Martin; Palmer, Richard; Sanz-Navarro, CF; Smith, R.

In: European Physical Journal B. Condensed Matter and Complex Systems, Vol. 16, 01.01.2001, p. 115-118.

Research output: Contribution to journalLetter

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Kenny, Daniel ; Weller, Suzanne ; Couillard, Martin ; Palmer, Richard ; Sanz-Navarro, CF ; Smith, R. / Measuring the implantation depth of silver clusters in graphite. In: European Physical Journal B. Condensed Matter and Complex Systems. 2001 ; Vol. 16. pp. 115-118.

Bibtex

@article{d9c0330b7b5f4a67afd16256ed347568,
title = "Measuring the implantation depth of silver clusters in graphite",
abstract = "Scanning tunnelling microscopy (STM) and molecular dynamics (MD) simulations have been used to investigate the implantation of Ag-7(-) clusters into the graphite surface. An experimental measure of the implantation depth of individual clusters is gained via thermal oxidation of the bombarded graphite surfaces. This process results in etching of the cluster-induced defects to form etch pits which grow laterally whilst retaining the depth of the implanted cluster. STM imaging of the etch pits reveals the distribution of implantation depths for deposition energies of 2 keV and 5 keV. Molecular dynamics simulations for clusters of 5 keV energy show that the implantation depth for Ag-7(-) is largely independent of the impact site on the graphite surface and the cluster orientation. The implantation depth found by MD lies at the upper edge of the experimental depth distribution.",
author = "Daniel Kenny and Suzanne Weller and Martin Couillard and Richard Palmer and CF Sanz-Navarro and R Smith",
year = "2001",
month = jan,
day = "1",
language = "English",
volume = "16",
pages = "115--118",
journal = "European Physical Journal B. Condensed Matter and Complex Systems",
issn = "1434-6028",
publisher = "EDP Sciences",

}

RIS

TY - JOUR

T1 - Measuring the implantation depth of silver clusters in graphite

AU - Kenny, Daniel

AU - Weller, Suzanne

AU - Couillard, Martin

AU - Palmer, Richard

AU - Sanz-Navarro, CF

AU - Smith, R

PY - 2001/1/1

Y1 - 2001/1/1

N2 - Scanning tunnelling microscopy (STM) and molecular dynamics (MD) simulations have been used to investigate the implantation of Ag-7(-) clusters into the graphite surface. An experimental measure of the implantation depth of individual clusters is gained via thermal oxidation of the bombarded graphite surfaces. This process results in etching of the cluster-induced defects to form etch pits which grow laterally whilst retaining the depth of the implanted cluster. STM imaging of the etch pits reveals the distribution of implantation depths for deposition energies of 2 keV and 5 keV. Molecular dynamics simulations for clusters of 5 keV energy show that the implantation depth for Ag-7(-) is largely independent of the impact site on the graphite surface and the cluster orientation. The implantation depth found by MD lies at the upper edge of the experimental depth distribution.

AB - Scanning tunnelling microscopy (STM) and molecular dynamics (MD) simulations have been used to investigate the implantation of Ag-7(-) clusters into the graphite surface. An experimental measure of the implantation depth of individual clusters is gained via thermal oxidation of the bombarded graphite surfaces. This process results in etching of the cluster-induced defects to form etch pits which grow laterally whilst retaining the depth of the implanted cluster. STM imaging of the etch pits reveals the distribution of implantation depths for deposition energies of 2 keV and 5 keV. Molecular dynamics simulations for clusters of 5 keV energy show that the implantation depth for Ag-7(-) is largely independent of the impact site on the graphite surface and the cluster orientation. The implantation depth found by MD lies at the upper edge of the experimental depth distribution.

M3 - Letter

VL - 16

SP - 115

EP - 118

JO - European Physical Journal B. Condensed Matter and Complex Systems

JF - European Physical Journal B. Condensed Matter and Complex Systems

SN - 1434-6028

ER -