Measurements of micromachined waveguide devices at WR-3 band using a T/R-T module based network analyzer

Yi Wang*, Michael J. Lancaster, Maolong Ke, Xiaobang Shang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Making accurate and reliable measurements at WR-3 band is challenging. This is made more so when a T/R-T based test configuration is used. This paper compared the calibrations and measurements between a T/R-T and a full T/R-T/R configuration. The shortfall of load matching in the T/R-T configuration has been identified and described using signal flow analyses. The effects of both the device performance and the load match on the measurement uncertainty have been studied. The insertion of an attenuator at the T-module test port has been used to overcome the poor load matching, and significant improvements have been achieved on the measurements of micromachined waveguide devices.

Original languageEnglish
Title of host publication2011 77th ARFTG Microwave Measurement Conference
Subtitle of host publicationDesign and Measurement of Microwave Systems, ARFTG 2011
DOIs
Publication statusPublished - 1 Nov 2011
Event2011 77th ARFTG Microwave Measurement Conference: Design and Measurement of Microwave Systems, ARFTG 2011 - Baltimore, MD, United States
Duration: 10 Jun 201110 Jun 2011

Conference

Conference2011 77th ARFTG Microwave Measurement Conference: Design and Measurement of Microwave Systems, ARFTG 2011
Country/TerritoryUnited States
CityBaltimore, MD
Period10/06/1110/06/11

Keywords

  • Micromachining
  • Millimeter wave devices
  • Millimeter wave measurements

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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