LT-PRPG: Power minimization technique for test-per-scan BIST

Research output: Contribution to conference (unpublished)Paper

Authors

Colleges, School and Institutes

Details

Original languageEnglish
Pages1-5
Number of pages5
Publication statusPublished - 27 Mar 2008
Event2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era -
Duration: 27 Mar 2008 → …

Conference

Conference2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era
Period27/03/08 → …