LT-PRPG: Power minimization technique for test-per-scan BIST

AS Abu-Issa, Steven Quigley

Research output: Contribution to conference (unpublished)Paper

5 Citations (Scopus)
Original languageEnglish
Pages1-5
Number of pages5
DOIs
Publication statusPublished - 27 Mar 2008
Event2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era -
Duration: 27 Mar 2008 → …

Conference

Conference2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era
Period27/03/08 → …

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