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Abstract
Secondary-electron emission (SEE) spectra have been obtained with the Scanning Probe Energy Loss Spectrometer at a tip-sample distance of only 50 nm. Such short working distances are required for the best theoretical spatial resolution (
Original language | English |
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Pages (from-to) | 474206 |
Number of pages | 1 |
Journal | Journal of Physics: Condensed Matter |
Volume | 21 |
Issue number | 47 |
DOIs | |
Publication status | Published - 1 Nov 2009 |
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Dive into the research topics of 'Local secondary-electron emission spectra of graphite and gold surfaces obtained using the Scanning Probe Energy Loss Spectrometer (SPELS)'. Together they form a unique fingerprint.Projects
- 1 Finished
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Scanning Probe Electron AnalyseR (SPEAR)
Palmer, R.
Engineering & Physical Science Research Council
1/01/07 → 30/06/10
Project: Research Councils