Investigating artefacts associated with α particle interactions in charge coupled devices

Rosie Newton; Mike J. Scott; James W. Dickinson; Ben Phoenix; David J. Parker; Carl Wheldon; Stuart Pirrie; Anthony Turner; Tzany Kokalova; Malcolm J. Joyce

doi:10.1109/NSSMIC.2017.8533021

Investigating artefacts associated with α particle interactions in charge coupled devices

Rosie Newton, Mike J. Scott, James W. Dickinson, Ben Phoenix, David J. Parker, Carl Wheldon, Stuart Pirrie, Anthony Turner, Tzany Kokalova, Malcolm J. Joyce

Physics and Astronomy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The response of charge coupled devices (CCDs) to α radiation has been investigated to assess the potential of using these devices to perform α-particle detection and measurement. Previous research indicates that α radiation leaves distinctive patterns in the images produced by CCDs when compared with other types of radiation. In this research, CCD responses to α and β radiation have been compared to highlight these differences. The CCD used was a Sony ICX825AL interline transfer CCD with an 9.98 × 6.71 mm imaging area consisting of 1392 × 1040 pixels, each of size 6.45 × 6.45 μm, covered with a thin aluminised Mylar film to stop exposure to light. Images have been taken of exposures to a 210Po source and horizontal streaks have been observed. It is thought the horizontal streaks are caused by the charge produced by the α particles being read out over several cycles. The average length of the streaks was found to be 14.5 ± 2.0 pixels. Future research will be done to further assess streaks produced by different energy α particles to investigate the potential of using CCDs for spectroscopy, using the MC40 cyclotron at the University of Birmingham.

Original language	English
Title of host publication	2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Number of pages	4
ISBN (Electronic)	978-1-5386-2282-7
ISBN (Print)	978-1-5386-2283-4 (PoD)
DOIs	https://doi.org/10.1109/NSSMIC.2017.8533021
Publication status	Published - 12 Nov 2018
Event	2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Atlanta, United States Duration: 21 Oct 2017 → 28 Oct 2017

Publication series

Name	IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
Volume	2017
ISSN (Print)	1082-3654
ISSN (Electronic)	2577-0829

Conference

Conference	2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017
Country/Territory	United States
City	Atlanta
Period	21/10/17 → 28/10/17

Keywords

Charge coupled devices
Spectroscopy
Cyclotrons
CCD image sensors
Alpha particles
Atmospheric measurements

ASJC Scopus subject areas

Instrumentation
Radiology Nuclear Medicine and imaging
Nuclear and High Energy Physics

Access to Document

10.1109/NSSMIC.2017.8533021Licence: None: All rights reserved

Cite this

Newton, R., Scott, M. J., Dickinson, J. W., Phoenix, B., Parker, D. J., Wheldon, C., Pirrie, S., Turner, A., Kokalova, T., & Joyce, M. J. (2018). Investigating artefacts associated with α particle interactions in charge coupled devices. In 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings Article 8533021 (IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC); Vol. 2017). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/NSSMIC.2017.8533021

Newton, Rosie ; Scott, Mike J. ; Dickinson, James W. et al. / Investigating artefacts associated with α particle interactions in charge coupled devices. 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers (IEEE), 2018. (IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)).

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title = "Investigating artefacts associated with α particle interactions in charge coupled devices",

abstract = "The response of charge coupled devices (CCDs) to α radiation has been investigated to assess the potential of using these devices to perform α-particle detection and measurement. Previous research indicates that α radiation leaves distinctive patterns in the images produced by CCDs when compared with other types of radiation. In this research, CCD responses to α and β radiation have been compared to highlight these differences. The CCD used was a Sony ICX825AL interline transfer CCD with an 9.98 × 6.71 mm imaging area consisting of 1392 × 1040 pixels, each of size 6.45 × 6.45 μm, covered with a thin aluminised Mylar film to stop exposure to light. Images have been taken of exposures to a 210Po source and horizontal streaks have been observed. It is thought the horizontal streaks are caused by the charge produced by the α particles being read out over several cycles. The average length of the streaks was found to be 14.5 ± 2.0 pixels. Future research will be done to further assess streaks produced by different energy α particles to investigate the potential of using CCDs for spectroscopy, using the MC40 cyclotron at the University of Birmingham. ",

keywords = "Charge coupled devices, Spectroscopy, Cyclotrons, CCD image sensors, Alpha particles, Atmospheric measurements",

author = "Rosie Newton and Scott, {Mike J.} and Dickinson, {James W.} and Ben Phoenix and Parker, {David J.} and Carl Wheldon and Stuart Pirrie and Anthony Turner and Tzany Kokalova and Joyce, {Malcolm J.}",

year = "2018",

month = nov,

day = "12",

doi = "10.1109/NSSMIC.2017.8533021",

language = "English",

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series = "IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

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note = "2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 ; Conference date: 21-10-2017 Through 28-10-2017",

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Newton, R, Scott, MJ, Dickinson, JW, Phoenix, B, Parker, DJ , Wheldon, C, Pirrie, S, Turner, A, Kokalova, T & Joyce, MJ 2018, Investigating artefacts associated with α particle interactions in charge coupled devices. in 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings., 8533021, IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), vol. 2017, Institute of Electrical and Electronics Engineers (IEEE), 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017, Atlanta, United States, 21/10/17. https://doi.org/10.1109/NSSMIC.2017.8533021

Investigating artefacts associated with α particle interactions in charge coupled devices. / Newton, Rosie; Scott, Mike J.; Dickinson, James W. et al.
2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers (IEEE), 2018. 8533021 (IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC); Vol. 2017).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Newton, Rosie

AU - Scott, Mike J.

AU - Dickinson, James W.

AU - Phoenix, Ben

AU - Parker, David J.

AU - Wheldon, Carl

AU - Pirrie, Stuart

AU - Turner, Anthony

AU - Kokalova, Tzany

AU - Joyce, Malcolm J.

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N2 - The response of charge coupled devices (CCDs) to α radiation has been investigated to assess the potential of using these devices to perform α-particle detection and measurement. Previous research indicates that α radiation leaves distinctive patterns in the images produced by CCDs when compared with other types of radiation. In this research, CCD responses to α and β radiation have been compared to highlight these differences. The CCD used was a Sony ICX825AL interline transfer CCD with an 9.98 × 6.71 mm imaging area consisting of 1392 × 1040 pixels, each of size 6.45 × 6.45 μm, covered with a thin aluminised Mylar film to stop exposure to light. Images have been taken of exposures to a 210Po source and horizontal streaks have been observed. It is thought the horizontal streaks are caused by the charge produced by the α particles being read out over several cycles. The average length of the streaks was found to be 14.5 ± 2.0 pixels. Future research will be done to further assess streaks produced by different energy α particles to investigate the potential of using CCDs for spectroscopy, using the MC40 cyclotron at the University of Birmingham.

AB - The response of charge coupled devices (CCDs) to α radiation has been investigated to assess the potential of using these devices to perform α-particle detection and measurement. Previous research indicates that α radiation leaves distinctive patterns in the images produced by CCDs when compared with other types of radiation. In this research, CCD responses to α and β radiation have been compared to highlight these differences. The CCD used was a Sony ICX825AL interline transfer CCD with an 9.98 × 6.71 mm imaging area consisting of 1392 × 1040 pixels, each of size 6.45 × 6.45 μm, covered with a thin aluminised Mylar film to stop exposure to light. Images have been taken of exposures to a 210Po source and horizontal streaks have been observed. It is thought the horizontal streaks are caused by the charge produced by the α particles being read out over several cycles. The average length of the streaks was found to be 14.5 ± 2.0 pixels. Future research will be done to further assess streaks produced by different energy α particles to investigate the potential of using CCDs for spectroscopy, using the MC40 cyclotron at the University of Birmingham.

KW - Charge coupled devices

KW - Spectroscopy

KW - Cyclotrons

KW - CCD image sensors

KW - Alpha particles

KW - Atmospheric measurements

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M3 - Conference contribution

AN - SCOPUS:85058453627

SN - 978-1-5386-2283-4 (PoD)

T3 - IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

BT - 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings

PB - Institute of Electrical and Electronics Engineers (IEEE)

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Newton R, Scott MJ, Dickinson JW, Phoenix B, Parker DJ , Wheldon C et al. Investigating artefacts associated with α particle interactions in charge coupled devices. In 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers (IEEE). 2018. 8533021. (IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)). doi: 10.1109/NSSMIC.2017.8533021

Investigating artefacts associated with α particle interactions in charge coupled devices

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

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