Improved sectioning in a slit scanning confocal microscope

Research output: Contribution to journalArticlepeer-review


  • Vincent Poher
  • Gordon T. Kennedy
  • Hugh B. Manning
  • Haoxiang X. Zhang
  • Erdan Gu
  • Martin D. Dawson
  • Paul M. W. French
  • Mark A. A. Neil

Colleges, School and Institutes


We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case. (C) 2008 Optical Society of America.


Original languageEnglish
Pages (from-to)1813-1815
Number of pages3
JournalOptics Letters
Issue number16
Publication statusPublished - 15 Aug 2008