Imaging surfaces with reflected electrons from a field emission scanning tunnelling microscope: image contrast mechanisms

Research output: Contribution to journalLetter

Authors

Colleges, School and Institutes

Abstract

Electrons backscattered from a scanning tunnelling microscope operating in the field emission mode have been collected to produce images of a rough Si(1 1 1) surface. We have obtained a spatial resolution of about 40 nm in such images. Comparison between backscattered electron images and topographic images reveals that edge enhancement and shadowing are important contrast mechanisms.

Details

Original languageEnglish
Pages (from-to)1849-1852
Number of pages4
JournalJournal of Physics D: Applied Physics
Volume34
Publication statusPublished - 1 Jan 2001