High-energy, high-resolution, fly-scan X-ray phase tomography

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High-energy, high-resolution, fly-scan X-ray phase tomography. / Cai, Biao.

In: Scientific Reports, Vol. 9, No. 1, 8913, 20.06.2019, p. 8913.

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@article{64b5d1f5080e4e2bb03cfb78d616c7d0,
title = "High-energy, high-resolution, fly-scan X-ray phase tomography",
abstract = "High energy X-ray phase contrast tomography is tremendously beneficial to the study of thick and dense materials with poor attenuation contrast. Recently, the X-ray speckle-based imaging technique has attracted widespread interest because multimodal contrast images can now be retrieved simultaneously using an inexpensive wavefront modulator and a less stringent experimental setup. However, it is time-consuming to perform high resolution phase tomography with the conventional step-scan mode because the accumulated time overhead severely limits the speed of data acquisition for each projection. Although phase information can be extracted from a single speckle image, the spatial resolution is deteriorated due to the use of a large correlation window to track the speckle displacement. Here we report a fast data acquisition strategy utilising a fly-scan mode for near field X-ray speckle-based phase tomography. Compared to the existing step-scan scheme, the data acquisition time can be significantly reduced by more than one order of magnitude without compromising spatial resolution. Furthermore, we have extended the proposed speckle-based fly-scan phase tomography into the previously challenging high X-ray energy region (120keV). This development opens up opportunities for a wide range of applications where exposure time and radiation dose are critical.",
author = "Biao Cai",
year = "2019",
month = jun
day = "20",
doi = "10.1038/s41598-019-45561-w",
language = "English",
volume = "9",
pages = "8913",
journal = "Scientific Reports",
issn = "2045-2322",
publisher = "Nature Publishing Group",
number = "1",

}

RIS

TY - JOUR

T1 - High-energy, high-resolution, fly-scan X-ray phase tomography

AU - Cai, Biao

PY - 2019/6/20

Y1 - 2019/6/20

N2 - High energy X-ray phase contrast tomography is tremendously beneficial to the study of thick and dense materials with poor attenuation contrast. Recently, the X-ray speckle-based imaging technique has attracted widespread interest because multimodal contrast images can now be retrieved simultaneously using an inexpensive wavefront modulator and a less stringent experimental setup. However, it is time-consuming to perform high resolution phase tomography with the conventional step-scan mode because the accumulated time overhead severely limits the speed of data acquisition for each projection. Although phase information can be extracted from a single speckle image, the spatial resolution is deteriorated due to the use of a large correlation window to track the speckle displacement. Here we report a fast data acquisition strategy utilising a fly-scan mode for near field X-ray speckle-based phase tomography. Compared to the existing step-scan scheme, the data acquisition time can be significantly reduced by more than one order of magnitude without compromising spatial resolution. Furthermore, we have extended the proposed speckle-based fly-scan phase tomography into the previously challenging high X-ray energy region (120keV). This development opens up opportunities for a wide range of applications where exposure time and radiation dose are critical.

AB - High energy X-ray phase contrast tomography is tremendously beneficial to the study of thick and dense materials with poor attenuation contrast. Recently, the X-ray speckle-based imaging technique has attracted widespread interest because multimodal contrast images can now be retrieved simultaneously using an inexpensive wavefront modulator and a less stringent experimental setup. However, it is time-consuming to perform high resolution phase tomography with the conventional step-scan mode because the accumulated time overhead severely limits the speed of data acquisition for each projection. Although phase information can be extracted from a single speckle image, the spatial resolution is deteriorated due to the use of a large correlation window to track the speckle displacement. Here we report a fast data acquisition strategy utilising a fly-scan mode for near field X-ray speckle-based phase tomography. Compared to the existing step-scan scheme, the data acquisition time can be significantly reduced by more than one order of magnitude without compromising spatial resolution. Furthermore, we have extended the proposed speckle-based fly-scan phase tomography into the previously challenging high X-ray energy region (120keV). This development opens up opportunities for a wide range of applications where exposure time and radiation dose are critical.

UR - http://www.scopus.com/inward/record.url?scp=85067629990&partnerID=8YFLogxK

U2 - 10.1038/s41598-019-45561-w

DO - 10.1038/s41598-019-45561-w

M3 - Article

C2 - 31222085

VL - 9

SP - 8913

JO - Scientific Reports

JF - Scientific Reports

SN - 2045-2322

IS - 1

M1 - 8913

ER -