High resolution studies of low energy electron attachment to SF3Cl: product anions and absolute cross sections

Research output: Contribution to journalArticlepeer-review


  • M Braun
  • MW Ruf
  • H Hotop
  • P Cicman
  • P Scheier
  • TD Märk
  • E Illenberger

Colleges, School and Institutes


Low energy electron attachment to SF\(_5\)Cl was studied at high energy resolution by mass spectrometric detection of the product anions. Two variants of the laser photoelectron attachment (LPA) technique (Kaiserslautern) were used for determining the threshold behaviour of the yield for SF\(_5^-\) formation at about 1 meV resolution, and to investigate the relative cross sections for Cl\(^-\), FCl\(^-\), and SF\(_5^-\) formation towards higher energies (up to 1 eV) at about 20 meV resolution. Thermal swarm measurements (Birmingham) were used to place the relative LPA cross sections on an absolute scale. A trochoidal electron monochromator (Innsbruck) was used for survey measurements of the relative cross sections for the different product anions over the energy range of 0-14 eV with a resolution of 0.30 eV. Combined with earlier beam data (taken at Berlin, J. Chem. Phys. 88 (1988) 149), the present experimental results provide a detailed set of partial cross sections for anion formation in low-energy electron collisions with SF\(_5\)Cl.


Original languageEnglish
Pages (from-to)234-241
JournalInternational Journal of Mass Spectrometry
Issue number3
Publication statusPublished - 1 Jun 2006


  • SF5Cl, mass spectrometry, cross section, branching ratio, electron attachment