Fabrication of Step-and-Flash imprint lithography (S-FIL) templates using XeF2 enhanced focused Ion Beam Etching

J Kettle, RT Hoyle, Stefan Dimov

Research output: Contribution to journalArticle

5 Citations (Scopus)
Original languageEnglish
Pages (from-to)819-825
Number of pages7
JournalJournal of Applied Physics
Volume96
Issue number4
Publication statusPublished - 1 Jan 2009

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