Experimental and simulation study of the effect of pipette roughness on giga-seal formation in patch clamping

M Malboubi, Y Gu, Kyle Jiang

Research output: Contribution to conference (unpublished) › Paper

9 Citations (Scopus)

Original language	English
Pages	778-781
Number of pages	4
DOIs	https://doi.org/10.1016/j.mee.2009.11.115
Publication status	Published - 1 May 2010
Event	35th International Conference on Micro-and Nano-Engineering, Sep 28-Oct 01, 2009. Ghent, Belgium - Duration: 1 May 2010 → …

Conference	35th International Conference on Micro-and Nano-Engineering, Sep 28-Oct 01, 2009. Ghent, Belgium
Period	1/05/10 → …

Keywords

@conference{4282dd26d82e45849afa24d993679852,

title = "Experimental and simulation study of the effect of pipette roughness on giga-seal formation in patch clamping",

keywords = "Patch clamping, Focused ion beam, Roughness, FEA modelling, Micromanipulator, Pipette",

author = "M Malboubi and Y Gu and Kyle Jiang",

year = "2010",

month = may,

day = "1",

doi = "10.1016/j.mee.2009.11.115",

language = "English",

pages = "778--781",

note = "35th International Conference on Micro-and Nano-Engineering, Sep 28-Oct 01, 2009. Ghent, Belgium ; Conference date: 01-05-2010",

}

TY - CONF

T1 - Experimental and simulation study of the effect of pipette roughness on giga-seal formation in patch clamping

AU - Malboubi, M

AU - Gu, Y

AU - Jiang, Kyle

PY - 2010/5/1

Y1 - 2010/5/1

KW - Patch clamping

KW - Focused ion beam

KW - Roughness

KW - FEA modelling

KW - Micromanipulator

KW - Pipette

U2 - 10.1016/j.mee.2009.11.115

DO - 10.1016/j.mee.2009.11.115

M3 - Paper

SP - 778

EP - 781

T2 - 35th International Conference on Micro-and Nano-Engineering, Sep 28-Oct 01, 2009. Ghent, Belgium

Y2 - 1 May 2010

ER -