Evaluating the reliability of defect-tolerant architectures for nanotechnology with probabilistic model checking

Research output: Contribution to conference (unpublished)Paper

Colleges, School and Institutes

Details

Original languageEnglish
Pages907-914
Number of pages8
Publication statusPublished - 1 Jan 2004
EventIntenational Conference on VLSI Design -
Duration: 1 Jan 2004 → …

Conference

ConferenceIntenational Conference on VLSI Design
Period1/01/04 → …