Enhanced reflection from inverse tapered nanocone arrays

Research output: Contribution to journalArticle

Authors

  • Xiang-tian Kong
  • Chuan Kangwanwatana
  • Yunuen Montelongo
  • Sunan Deng
  • Fernando Da Cruz Vasconcellos
  • Malik M. Qasim
  • Timothy D. Wilkinson
  • Qing Dai

Colleges, School and Institutes

External organisations

  • University of Cambridge
  • National Center for Nanoscience and Technology, Beijing 100190, China

Abstract

We computationally and experimentally demonstrate enhanced reflection effects displayed by silicon-based inverted nanocone arrays. A 3D finite element model is used to characterize the optical properties of the nanocone arrays with respect to the change in polarization and incident angles. The nanocone arrays are fabricated by e-beam lithography in hexagonal and triangular geometries with a lattice constant of 300 nm. The fabricated devices show a two-fold increase in reflection compared with bare silicon surface, as well as a strong diffraction within the visible and near-infrared spectra. The nanocone arrays may find a variety of applications from optical devices to energy conservation technologies.

Details

Original languageEnglish
Article number053108
JournalApplied Physics Letters
Volume105
Issue number5
Publication statusPublished - 4 Aug 2014

Keywords

  • Silicon, Light diffraction, Nanostructures, Polarization, Reflectivity