Electron microscopy study of direct laser deposited IN718

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Electron microscopy study of direct laser deposited IN718. / Ding, Rengen; Huang, ZW; Li, Hangyue; Mitchell, I.; Baxter, G.; Bowen, P.

In: Materials Characterization, Vol. 106, 08.2015, p. 324-337.

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@article{afd8c1144f3a4969b95951d1853fc15f,
title = "Electron microscopy study of direct laser deposited IN718",
abstract = "The microstructure of direct laser deposited (DLD) IN718 has been investigated in detail using scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The results confirm that the dendrite core microstructure can be linked to the cooling rate experienced during the deposition. A ~ 100 μm wide δ partially dissolved region in the IN718 substrate was observed close to the substrate/deposit boundary. In the deposited IN718, γ/Laves eutectic constituent is the predominant minor microconstituent. Irregular and regular (small) (Nb,Ti)C carbides and a mixture of the carbides and Laves were observed. Most M3B2 borides were nucleated around a (Nb,Ti)C carbide. Needles of δ phase precipitated from the Laves phase were also observed. A complex constituent (of Laves, δ, α-Cr, γ″, and γ matrix) is reported in IN718 for the first time. The formation of α-Cr particles could be related to Cr rejection during the formation and growth of Cr-depleted δ phase.",
keywords = "IN718, Laser deposition, Microstructure, TEM",
author = "Rengen Ding and ZW Huang and Hangyue Li and I. Mitchell and G. Baxter and P. Bowen",
year = "2015",
month = aug,
doi = "10.1016/j.matchar.2015.06.017",
language = "English",
volume = "106",
pages = "324--337",
journal = "Materials Characterization",
issn = "1044-5803",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - Electron microscopy study of direct laser deposited IN718

AU - Ding, Rengen

AU - Huang, ZW

AU - Li, Hangyue

AU - Mitchell, I.

AU - Baxter, G.

AU - Bowen, P.

PY - 2015/8

Y1 - 2015/8

N2 - The microstructure of direct laser deposited (DLD) IN718 has been investigated in detail using scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The results confirm that the dendrite core microstructure can be linked to the cooling rate experienced during the deposition. A ~ 100 μm wide δ partially dissolved region in the IN718 substrate was observed close to the substrate/deposit boundary. In the deposited IN718, γ/Laves eutectic constituent is the predominant minor microconstituent. Irregular and regular (small) (Nb,Ti)C carbides and a mixture of the carbides and Laves were observed. Most M3B2 borides were nucleated around a (Nb,Ti)C carbide. Needles of δ phase precipitated from the Laves phase were also observed. A complex constituent (of Laves, δ, α-Cr, γ″, and γ matrix) is reported in IN718 for the first time. The formation of α-Cr particles could be related to Cr rejection during the formation and growth of Cr-depleted δ phase.

AB - The microstructure of direct laser deposited (DLD) IN718 has been investigated in detail using scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The results confirm that the dendrite core microstructure can be linked to the cooling rate experienced during the deposition. A ~ 100 μm wide δ partially dissolved region in the IN718 substrate was observed close to the substrate/deposit boundary. In the deposited IN718, γ/Laves eutectic constituent is the predominant minor microconstituent. Irregular and regular (small) (Nb,Ti)C carbides and a mixture of the carbides and Laves were observed. Most M3B2 borides were nucleated around a (Nb,Ti)C carbide. Needles of δ phase precipitated from the Laves phase were also observed. A complex constituent (of Laves, δ, α-Cr, γ″, and γ matrix) is reported in IN718 for the first time. The formation of α-Cr particles could be related to Cr rejection during the formation and growth of Cr-depleted δ phase.

KW - IN718

KW - Laser deposition

KW - Microstructure

KW - TEM

U2 - 10.1016/j.matchar.2015.06.017

DO - 10.1016/j.matchar.2015.06.017

M3 - Article

VL - 106

SP - 324

EP - 337

JO - Materials Characterization

JF - Materials Characterization

SN - 1044-5803

ER -