Electro-mechanical durability of pulsed-laser deposited indium tin oxide thin films on polycarbonate substrates for flexible electronic devices

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Standard

Electro-mechanical durability of pulsed-laser deposited indium tin oxide thin films on polycarbonate substrates for flexible electronic devices. / Potoczny, Grzegorz A.; Abell, J. Stuart; Kukureka, Stephen N.

31st International Display Research Conference 2011, EuroDisplay 2011. 2011. p. 77-80 (SID Conference Record of the International Display Research Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Harvard

Potoczny, GA, Abell, JS & Kukureka, SN 2011, Electro-mechanical durability of pulsed-laser deposited indium tin oxide thin films on polycarbonate substrates for flexible electronic devices. in 31st International Display Research Conference 2011, EuroDisplay 2011. SID Conference Record of the International Display Research Conference, pp. 77-80, 31st International Display Research Conference 2011, EuroDisplay 2011, Arcachon, France, 19/09/11.

APA

Potoczny, G. A., Abell, J. S., & Kukureka, S. N. (2011). Electro-mechanical durability of pulsed-laser deposited indium tin oxide thin films on polycarbonate substrates for flexible electronic devices. In 31st International Display Research Conference 2011, EuroDisplay 2011 (pp. 77-80). (SID Conference Record of the International Display Research Conference).

Vancouver

Potoczny GA, Abell JS, Kukureka SN. Electro-mechanical durability of pulsed-laser deposited indium tin oxide thin films on polycarbonate substrates for flexible electronic devices. In 31st International Display Research Conference 2011, EuroDisplay 2011. 2011. p. 77-80. (SID Conference Record of the International Display Research Conference).

Author

Potoczny, Grzegorz A. ; Abell, J. Stuart ; Kukureka, Stephen N. / Electro-mechanical durability of pulsed-laser deposited indium tin oxide thin films on polycarbonate substrates for flexible electronic devices. 31st International Display Research Conference 2011, EuroDisplay 2011. 2011. pp. 77-80 (SID Conference Record of the International Display Research Conference).

Bibtex

@inproceedings{114fdedafe504d2482cc281a229bf627,
title = "Electro-mechanical durability of pulsed-laser deposited indium tin oxide thin films on polycarbonate substrates for flexible electronic devices",
abstract = "Uniaxial tensile electro-fragmentation tests has shown conductive failure with infinite resistance immediately following the crack onset strain (COS) of high quality 100 nm-thick indium tin oxide (ITO) films pulsed-laser deposited on polycarbonate (PC) flexible substrates. Two possible conductive failure mechanisms of ITO/PC systems are proposed. The results show that the conductive failure immediately following COS is due to poor adhesion between the two components where high elastic mismatch may accelerate the failure mechanism.",
author = "Potoczny, {Grzegorz A.} and Abell, {J. Stuart} and Kukureka, {Stephen N.}",
year = "2011",
month = dec,
day = "1",
language = "English",
isbn = "9781618396006",
series = "SID Conference Record of the International Display Research Conference",
pages = "77--80",
booktitle = "31st International Display Research Conference 2011, EuroDisplay 2011",
note = "31st International Display Research Conference 2011, EuroDisplay 2011 ; Conference date: 19-09-2011 Through 22-09-2011",

}

RIS

TY - GEN

T1 - Electro-mechanical durability of pulsed-laser deposited indium tin oxide thin films on polycarbonate substrates for flexible electronic devices

AU - Potoczny, Grzegorz A.

AU - Abell, J. Stuart

AU - Kukureka, Stephen N.

PY - 2011/12/1

Y1 - 2011/12/1

N2 - Uniaxial tensile electro-fragmentation tests has shown conductive failure with infinite resistance immediately following the crack onset strain (COS) of high quality 100 nm-thick indium tin oxide (ITO) films pulsed-laser deposited on polycarbonate (PC) flexible substrates. Two possible conductive failure mechanisms of ITO/PC systems are proposed. The results show that the conductive failure immediately following COS is due to poor adhesion between the two components where high elastic mismatch may accelerate the failure mechanism.

AB - Uniaxial tensile electro-fragmentation tests has shown conductive failure with infinite resistance immediately following the crack onset strain (COS) of high quality 100 nm-thick indium tin oxide (ITO) films pulsed-laser deposited on polycarbonate (PC) flexible substrates. Two possible conductive failure mechanisms of ITO/PC systems are proposed. The results show that the conductive failure immediately following COS is due to poor adhesion between the two components where high elastic mismatch may accelerate the failure mechanism.

UR - http://www.scopus.com/inward/record.url?scp=84860842431&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84860842431

SN - 9781618396006

T3 - SID Conference Record of the International Display Research Conference

SP - 77

EP - 80

BT - 31st International Display Research Conference 2011, EuroDisplay 2011

T2 - 31st International Display Research Conference 2011, EuroDisplay 2011

Y2 - 19 September 2011 through 22 September 2011

ER -