Dielectric properties of pulsed-laser deposited indium tin oxide films

Gael Giusti, James Bowen, Q Ramasse, G Rey, Elizabeth Blackburn, Liang Tian, Ian Jones, John Abell

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@article{275270bcdeb844ffa6a88e43d166489e,

title = "Dielectric properties of pulsed-laser deposited indium tin oxide films",

author = "Gael Giusti and James Bowen and Q Ramasse and G Rey and Elizabeth Blackburn and Liang Tian and Ian Jones and John Abell",

year = "2012",

month = oct,

day = "5",

doi = "10.1016/j.tsf.2012.09.053",

language = "English",

volume = "524",

pages = "249--256",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

}

TY - JOUR

T1 - Dielectric properties of pulsed-laser deposited indium tin oxide films

AU - Giusti, Gael

AU - Bowen, James

AU - Ramasse, Q

AU - Rey, G

AU - Blackburn, Elizabeth

AU - Tian, Liang

AU - Jones, Ian

AU - Abell, John

PY - 2012/10/5

Y1 - 2012/10/5

U2 - 10.1016/j.tsf.2012.09.053

DO - 10.1016/j.tsf.2012.09.053

M3 - Article

SN - 0040-6090

VL - 524

SP - 249

EP - 256

JO - Thin Solid Films

JF - Thin Solid Films

ER -