Determination of excitation profile and dielectric function spatial nonuniformity in porous silicon by using WKB approach

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Determination of excitation profile and dielectric function spatial nonuniformity in porous silicon by using WKB approach. / He, Wei; Canham, Leigh T.; Loni, Armando; Kaplan, Andre.

In: Optics Express, Vol. 22, No. 22, 03.11.2014, p. 27123-27135.

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@article{0291ea284f74451c9f892ccb92801c3c,
title = "Determination of excitation profile and dielectric function spatial nonuniformity in porous silicon by using WKB approach",
abstract = "We develop an analytical model based on the WKB approach to evaluate the experimental results of the femtosecond pump-probe measurements of the transmittance and reflectance obtained on thin membranes of porous silicon. The model allows us to retrieve a pump-induced nonuniform complex dielectric function change along the membrane depth. We show that the model fitting to the experimental data requires a minimal number of fitting parameters while still complying with the restriction imposed by the Kramers-Kronig relation. The developed model has a broad range of applications for experimental data analysis and practical implementation in the design of devices involving a spatially nonuniform dielectric function, such as in biosensing, wave-guiding, solar energy harvesting, photonics and electro-optical devices.",
author = "Wei He and Canham, {Leigh T.} and Armando Loni and Andre Kaplan",
year = "2014",
month = nov,
day = "3",
doi = "10.1364/OE.22.027123",
language = "English",
volume = "22",
pages = "27123--27135",
journal = "Optics Express",
issn = "1094-4087",
publisher = "Optical Society of America",
number = "22",

}

RIS

TY - JOUR

T1 - Determination of excitation profile and dielectric function spatial nonuniformity in porous silicon by using WKB approach

AU - He, Wei

AU - Canham, Leigh T.

AU - Loni, Armando

AU - Kaplan, Andre

PY - 2014/11/3

Y1 - 2014/11/3

N2 - We develop an analytical model based on the WKB approach to evaluate the experimental results of the femtosecond pump-probe measurements of the transmittance and reflectance obtained on thin membranes of porous silicon. The model allows us to retrieve a pump-induced nonuniform complex dielectric function change along the membrane depth. We show that the model fitting to the experimental data requires a minimal number of fitting parameters while still complying with the restriction imposed by the Kramers-Kronig relation. The developed model has a broad range of applications for experimental data analysis and practical implementation in the design of devices involving a spatially nonuniform dielectric function, such as in biosensing, wave-guiding, solar energy harvesting, photonics and electro-optical devices.

AB - We develop an analytical model based on the WKB approach to evaluate the experimental results of the femtosecond pump-probe measurements of the transmittance and reflectance obtained on thin membranes of porous silicon. The model allows us to retrieve a pump-induced nonuniform complex dielectric function change along the membrane depth. We show that the model fitting to the experimental data requires a minimal number of fitting parameters while still complying with the restriction imposed by the Kramers-Kronig relation. The developed model has a broad range of applications for experimental data analysis and practical implementation in the design of devices involving a spatially nonuniform dielectric function, such as in biosensing, wave-guiding, solar energy harvesting, photonics and electro-optical devices.

UR - http://www.scopus.com/inward/record.url?scp=84920054259&partnerID=8YFLogxK

U2 - 10.1364/OE.22.027123

DO - 10.1364/OE.22.027123

M3 - Article

AN - SCOPUS:84920054259

VL - 22

SP - 27123

EP - 27135

JO - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 22

ER -