Cyclic Voltammetry Peaks Due to Deep Level Traps in Si Nanowire Array Electrodes

Abdurrahman Shougee, Foivia Konstantinou, Tim Albrecht, Kristel Fobelets

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Original language	English
Pages (from-to)	154-160
Journal	IEEE Transactions on Nanotechnology
Volume	17
Issue number	1
DOIs	https://doi.org/10.1109/TNANO.2017.2754581
Publication status	Published - Jan 2018

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