Critical dimension for the dislocation structure in deformed copper micropillars

X. X. Zhao, J. Wu*, Y. L. Chiu, I. P. Jones, R. Gu, A. H.W. Ngan

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

Although the effect of specimen size on strength has been well documented for metal micro-samples significantly larger than ~1 μm, less is known about the deformation induced dislocation structure, especially just above the size at which dislocation starvation happens. Here, uniaxial compression tests were performed on cylindrical [011] oriented copper micropillars with diameters of 1 μm, 3 μm and 5 μm. Dislocation cells formed in a fractal geometry in the 3 μm and 5 μm pillars, while dislocations were not retained in the 1 μm pillars. The effects of strain and strain rate on cell formation were also investigated.

Original languageEnglish
Pages (from-to)137-141
Number of pages5
JournalScripta Materialia
Volume163
Early online date22 Jan 2019
DOIs
Publication statusPublished - 1 Apr 2019

Keywords

  • Copper
  • Dislocation cell
  • Focussed ion beam (FIB)
  • Fractal
  • Micropillar

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys

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